OmniScan iX UT 這款儀器的設計目的是對航空航天制造業、汽車工業等的關鍵性工業部件、焊接部件進行高速檢測?？烧系狡渌鼨z測系統中使用，通過GE DFO P3TF22、P3TF30、P3TF31和P3TF35驗證。 概覽 Component testing Aerospace manufacturing Automobile in
這款儀器的設計目的是對航空航天制造業、汽車工業等的關鍵性工業部件、焊接部件進行高速檢測?？烧系狡渌鼨z測系統中使用，通過GE DFO P3TF22、P3TF30、P3TF31和P3TF35驗證。
The OmniScan® iX is an industrial ultrasonic flaw detector system designed for the high-speed testing of critical industrial components.
The compact OmniScan iX is housed in a rugged benchtop casing and is also available in a rack-mount version or with a swivel-arm assembly for easy integration into a production system.
The OmniScan iX is central to your industrial component testing system. Olympus provides all the software libraries required to enable the integrator to tie in your existing process control system.
In addition, we provide the user interface ports necessary to connect a display, keyboard, mouse, and external storage. The real-time programmable alarm and analog outputs, and the encoder outputs, enable easy integration of the mechanical and electronic components of your industrial process.
All that is needed for rapid and efficient component testing is built-in!
Complete Integrated Solution
Software Features
Strip Chart View
Full-Featured C-Scan Software
Hardware Features
Channel Configuration
The OmniScan iX can be configured for pulse-echo, pitch-and-catch, or sequence firing.
Component Testing
Component testing is typically performed under an assembly-line environment. The OmniScan® iX is used to accept or reject (go-no-go testing) thousands of parts a day. Multichannel instrument configurations lend themselves very well to assembly-line applications, which are aimed at detecting flaws within the various zones of a part-not just under one particular area with one transducer. 16 alarm outputs on the OmniScan iX allow the tracking of a particular zone and monitoring the zone that is giving the alarm conditions.
Engine-Disc Inspection
Critical inspection of turbine engine discs requires a very sensitive ultrasonic flaw detector capable of detecting small defects in difficult nickel-based metals. Such instruments must be able to operate at high gains, with extremely low noise on both the A-scan display as well as the analog output. The OmniScan iX meets these very demanding requirements. Additional OmniScan iX features such as strip-chart recorder, C-scan display, and back-echo attenuator make this a very versatile instrument. The OmniScan iX can easily drop into existing, older test stations, then later transfer to a full functional station to perform on-board mapping/C-scan.
The OmniScan iXhas been qualified by GE Aircraft Engines and added to the DFO as follows:
Hardware Options
OMNI-IX-A-RACK1: OmniScan iX rackmount bracket option
OMNI-IX-A-SWIV: OmniScan iX swivel-arm assembly
OMNI-IX-A-SCASE: OmniScan iX hard carrying case
OMNI-IX-A-ACC1: OmniScan iX accessory kit includes the following:
Software Options
OMNI-IX-SO-ENC1: OmniScan iX software option to activate two encoder inputs on the instrument
OMNI-IX-SO-BEA: OmniScan iX software option to activate back wall echo attenuator on the instrument
Standard Inclusions
| Overall dimensions (W × H × D) | |
| Benchtop version | 375 mm × 238 mm × 185 mm (14.75 in. × 9.4 in. × 7.3 in.) |
| Rack mount version | 485 mm × 222 mm × 190 mm (19 in. × 8.7 in. × 7.5 in.) |
| Weight | 6.5 kg (14.3 lb) |
| Connectors | BNC (2, 4 or 8) |
| Pulser/Receiver | |
| Number of pulsers/receivers | 2, 4 or 8 |
| Pulser | |
| Pulse output | 50 V, 100 V, 200 V, 300 V ±10% |
| Pulse width | Adjustable from 30 ns to 1000 ns ±10%, resolution of 2.5 ns |
| Fall time | Less than 7 ns |
| Pulse shape | Negative square wave |
| Output impedance | Less than 7 Ω |
| Receiver | |
| Receiver gain range | 0-100 dB, by steps of 0.1 dB |
| Maximum input signal | 20 V p-p (screen at 128%) |
| Minimum sensibility | 200 µV p-p (screen at 128%) |
| Noise referred to input | 160 µV p-p (26 µV RMS) (128%) |
| Input impedance | 50 Ω |
| Input filter (100% bandwidth) | Centered at 1 MHz (1.5 MHz), centered at 2 MHz (2.25 MHz), centered at 5 MHz (4 MHz), centered at 10 MHz (12 MHz), centered at 15 MHz, centered at 20 MHz, 0.25-2.5 MHz, 2-25 MHz BB |
| Bandwidth of the system | 0.25-35 MHz (-3 dB) |
| Rectifier | Both, positive, negative, none |
| Mode | PE (pulse-echo), PC (pitch-and-catch), TT (through-transmission). In P-P mode the maximum of number of pulsers equals the number of channels/2 |
| Smoothing | Digital |
| TCG | |
| Number of points | 16 |
| TCG range | Up to 40 dB |
| Maximum gain slope | 20 dB/µs |
| Data acquisition | |
| A-scan acquisition rate | 6000 A-scans/s (PRF/N, where N = number of channels) (512-point A-scan) |
| Maximum pulsing rate | 12 kHz (C-scan + Alarm mode). Up to 6 kHz with full A-scan recording |
| Data processing | |
| Real-time averaging | 2, 4, 8, 16 |
| Gates | |
| Quantity | 3 : I (synchro), A and B (measure) |
| Synchronization | I, A, B referenced on main bang, B referenced on gate I or A (post-synchronization) |
| Data storage | |
| A-scan recording (TOFD) | 6000 A-scans/s (512-point A-scan) (3 MB/s transfer rate) |
| C-scan type data recording | 10,000 (A1, A2, A3, T1, T2, T3) (3 gates) 10 kHz (lower frequency for corrosion mapping) |
| Data visualization | |
| Refresh rate | 60 Hz |
| Modes | A-scan, B-scan, C-scan, strip charts, multiple A-scans, and TOFD |
| Data synchronization | |
| On time | 1 Hz-12 kHz |
| On encoder | On 1 or 2 axes divided by 1 to 65,536 steps |
| Outputs and inputs | |
| Number of alarms | 16 (programmable, hold time and delay, filters for n occurrences) |
| Conditions | Any logical combination of gates |
| Signal | Amplitude or time of flight of gate A or B |
| Analog outputs (at full PRF) | 16 (0 V to +5 V) (programmable for each gate) |
| Digital inputs (DIN) | 4 programmable |
